This system is specifically designed for high-precision measurement of laser relative intensity noise (RIN). It is suitable for noise characterization of various light sources, including narrow-linewidth fiber lasers and semiconductor lasers. The system employs low-noise photodetection, high-resolution spectrum analysis, and digital signal processing technology to accurately characterize the intensity noise performance of lasers, providing reliable test data for scientific research and industrial applications.
Core Functions and Features
Measurable Wavelength Bands
C band, 1 μm, 780 nm, 2 μm, and visible wavelength bands
Wide Dynamic Range Measurement
Supports RIN testing from near the quantum limit (−160 dB/Hz) up to high-frequency ranges (>10 MHz), covering typical laser noise spectra.
High-Sensitivity Detection
Utilizes low-noise balanced detectors and high-linearity amplifiers to ensure accurate extraction of weak noise signals.
Multi-Band Analysis
Integrates baseband FFT analyzer and RF spectrum analyzer functions to enable noise power spectral density (PSD) measurements from DC to the GHz range.
Environmental Interference Resistance Design
Special vibration-isolation design enhances resistance to environmental interference, ensuring reliable operation even under harsh conditions.