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1.0 μm Ultra-Narrow Linewidth Single-Frequency Seed Source
1.0 μm Ultra-Narrow Linewidth Single-Frequency Seed Source

1.0 μm Ultra-Narrow Linewidth Single-Frequency Seed Source

The 1.0 μm ultra-stable low-noise laser seed source is designed for cutting-edge applications such as new energy laser driving, coherent LiDAR, precision interferometric measurement, and quantum optics. It adopts low relative intensity noise laser technology combined with a highly stable power control scheme, effectively suppressing system noise accumulation, achieving long-term stable output power with extremely low intensity fluctuations, and enhancing the detection sensitivity and application accuracy of related systems.

Product Features

Ultra-Low Noise Performance
High-Precision Frequency Stabilization Technology
Intelligent Control System

Typical Applications

New Energy Laser Driving
Coherent LiDAR
Precision Interferometric Measurement
Quantum Optics

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Technical ParameterUnitTechnical Specification
MinTypicalMax
Wavelength Rangenm 980–1120 
Laser Mode/Single Longitudinal Mode, Continuous Wave
Output PowermW102050
LinewidthkHz 10 
OSNRdB >50 
Relative Intensity NoisedB/Hz< −140 dB/Hz @ Peak
Power Instability%0.02 @ 1h (P-P)
Power Adjustment%10 100
Wavelength Tuning Rangepm 600 
Polarization/Linear Polarization
PERdB 20 
Beam Quality/M² < 1.2
Operating VoltageVDC5
Power ConsumptionW13
Operating Temperature°C−10 45
Storage Temperature°C−40 70
Output Fiber Type/PM980 / HI1060
Output Fiber Lengthm0.6
Output Connector/FC/APC, Optional
Dimensionsmm175 (L) × 140 (W) × 25 (H)

The 1.0 μm ultra-stable low-noise laser seed source is designed for cutting-edge applications such as new energy laser driving, coherent LiDAR, precision interferometric measurement, and quantum optics. It adopts low relative intensity noise laser technology combined with a highly stable power control scheme, effectively suppressing system noise accumulation, achieving long-term stable output power with extremely low intensity fluctuations, and enhancing the detection sensitivity and application accuracy of related systems.

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